Condensed Matter Physics, 2013, vol. 16, No. 3, p. 31706:1-10
DOI:10.5488/CMP.16.31706
arXiv:1309.6126
Title:
Dielectric properties of PLZT-x/65/35 (2≤x≤13) under mechanical stress, electric field and temperature loading
Author(s):
 
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K. Pytel
(Institute of Technology, Pedagogical University, 2 Podchorazych St., 30-084 Krakow, Poland)
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J. Suchanicz
(Institute of Physics, Pedagogical University, 2 Podchorazych St., 30-084 Krakow, Poland)
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M. Livinsh
(Institute of Solid State Physics, University of Latvia, 8 Kengaraga St., LV-1063 Riga, Latvia)
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A. Sternberg
(Institute of Solid State Physics, University of Latvia, 8 Kengaraga St., LV-1063 Riga, Latvia)
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We investigated the effect of uniaxial pressure (0÷1000 bars) applied parallely to the ac electric field on dielectric properties of PLZT-x/65/35 (2≤x≤13) ceramics. There was revealed a significant effect of the external stress on these properties. The application of uniaxial pressure leads to the change of the peak intensity of the electric permittivity (ϵ), of the frequency dispersion as well as of the dielectric hysteresis. The peak intensity ϵ becomes diffused/sharpened and shifts to a higher/lower temperatures with increasing the pressure. It was concluded that the application of uniaxial pressure induces similar effects as increasing the Ti ion concentration in PZT system. We interpreted our results based on the domain switching processes under the action of combined electromechanical loading.
Key words:
ferroelectric, PLZT-x/65/35, dielectric properties, uniaxial pressure
PACS:
77.84.Lf, 77.80.bg
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