Title: Investigating the effects of smoothness of interfaces on stability of probing nano-scale thin films by Neutron Reflectometry
Author(s):

	S.S. Jahromi (Department of Physics, K.N. Toosi University of Technology, P.O. Box 15875-4416, Tehran, Iran) ,
	S.F. Masoudi (Department of Physics, K.N. Toosi University of Technology, P.O. Box 15875-4416, Tehran, Iran)

Most of the reflectometry methods which are used for determining the phase of complex reflection coefficient such as Reference Method and Variation of Surroundings medium are based on solving the Schrödinger equation using a discontinuous and step-like scattering optical potential. However, during the deposition process for making a real sample the two adjacent layers are mixed together and the interface would not be discontinuous and sharp. The smearing of adjacent layers at the interface (smoothness of interface), would affect the the reflectivity, phase of reflection coefficient and reconstruction of the scattering length density (SLD) of the sample. In this paper, we have investigated the stability of Reference Method in the presence of smooth interfaces. The smoothness of interfaces is considered by using a continuous function scattering potential. We have also proposed a method to achieve the most reliable output result while retrieving the SLD of the sample.

Key words: neutron reflectometry, thin films, smooth potential, reference method
PACS: 68.35.-p, 63.22.Np

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